Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate
2007-08-31
2011-12-06
Alphonse, Fritz (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital data error correction
C714S768000, C714S774000
Reexamination Certificate
active
08074144
ABSTRACT:
Plural data lines read normal data stored in a first area in the memory cell array when the data lines are connected to a selected bit line. Plural parity data lines read parity data from a second area in the memory cell array different from the first area, the parity data being used for an error correction of the normal data stored in the memory cell. A first determination circuit compares the normal data read from the data lines and their expectation value, respectively, and determines whether the data and the expectation value coincide, respectively. A second determination circuit compares the parity data read from the parity data lines and their expectation value, respectively, and determines whether the data and the expectation value coincide, respectively. The second determination circuit includes a selection circuit that selectively outputs a determination result on a part of the parity data lines.
REFERENCES:
patent: 4679196 (1987-07-01), Tsujimoto
patent: 4809278 (1989-02-01), Kim et al.
patent: 5448578 (1995-09-01), Kim
patent: 6067656 (2000-05-01), Rusu et al.
patent: 6535452 (2003-03-01), Okuda et al.
patent: 6597595 (2003-07-01), Ichiriu et al.
patent: 7032142 (2006-04-01), Fujioka et al.
patent: 2006/0156213 (2006-07-01), Kikutake et al.
patent: 6-68700 (1994-03-01), None
patent: 2002-33360 (2002-01-01), None
patent: 2003-173698 (2003-06-01), None
patent: 2006-172649 (2006-06-01), None
Office Action issued Aug. 31, 2011 in Taiwanese Application No. 096130199 filed Aug. 15, 2007 (w/English translation).
Kanagawa Naoaki
Kawaguchi Kazuaki
Alphonse Fritz
Kabushiki Kaisha Toshiba
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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