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Semiconductor integrated circuit device comprising synchronous D

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Semiconductor integrated circuit device having a test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor integrated circuit device incorporating a data...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit device with test data...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit device, method of testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit with full-speed data...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit with full-speed data...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit with full-speed data...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit with full-speed data...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit with memory redundancy circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit, design support software...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory apparatus having noise generating block...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory capable of relieving a defective memory...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory capable of verifying stored data

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor memory device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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