Semiconductor memory apparatus having noise generating block...

Details Semiconductor memory apparatus having noise generating block... Semiconductor memory apparatus having noise generating block...

2011-05-03

2011-05-03

Tabone, Jr., John J (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C702S111000, C324S763010, C324S765010, C365S201000

Reexamination Certificate

active

07937629

ABSTRACT:
Disclosed are a semiconductor memory apparatus and a method of testing the same. The semiconductor memory apparatus includes memory banks, each of which includes a plurality of memory cells, a peripheral circuit unit that includes a plurality of circuit groups around the memory banks, and a noise generating block that is disposed in the peripheral circuit unit and selectively applies a noise to the memory banks in a test mode.

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