Semiconductor integrated circuit device incorporating a data...

Details Semiconductor integrated circuit device incorporating a data... Semiconductor integrated circuit device incorporating a data...

2004-12-16

2009-12-29

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S189011

Reexamination Certificate

active

07640466

ABSTRACT:
A semiconductor integrated circuit device includes a data memory which stores write data, a holding circuit which holds the write data, a data write circuit which, during a write operation in a normal mode, supplies the write data held in the holding circuit to the data memory, and, during a write operation in a testing mode, inverts or does not invert the write data held in the holding circuit in accordance with an inversion control signal having a frequency substantially equal to a frequency of the write operation in the normal mode, and supplies the data to the data memory, and a data read circuit which outputs readout data from the data memory.

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