Integrated circuit test mode with externally forced...
Integrated circuit with voltage over-stress indicating circuit
Integrated memory and method for testing the memory
Integrated memory device and method for its testing and...
Integrated memory having a test circuit for functional...
Integrated scannable interface for testing memory
Integrated semiconductor memory
Integrated semiconductor memory
Interleaving apparatus and method for orthogonal frequency...
Internal cache for on chip test data storage
Internal memory in application specific integrated circuit...
Internal signal test device and method thereof
Internally generating patterns for testing in an integrated...
Linked lists diagnostics
Logical verification apparatus and method for memory control...
Loop-Back Memory-Module Extender Card for Self-Testing...
Low cost built-in self test state machine for general...
Low power content-addressable-memory device
Low yield analysis of embedded memory
Low-power content-addressable-memory device