Internally generating patterns for testing in an integrated...

Details Internally generating patterns for testing in an integrated... Internally generating patterns for testing in an integrated...

2007-12-25

2007-12-25

Ton, David (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S733000

Reexamination Certificate

active

11083473

ABSTRACT:
In a first integrated circuit chip contained in a single package along with a second integrated circuit chip, a system includes circuitry on the first integrated circuit chip for receiving address signals from the second integrated circuit chip during normal operation. Circuitry on the first integrated circuit chip generates address signals for use in testing the first integrated chip in a test mode.

REFERENCES:
patent: 4263650 (1981-04-01), Bennett et al.
patent: 4698830 (1987-10-01), Barzilai et al.
patent: 4743841 (1988-05-01), Takeuchi
patent: 4773028 (1988-09-01), Tallman
patent: 4825414 (1989-04-01), Kawata
patent: 4873669 (1989-10-01), Furutani et al.
patent: 5151881 (1992-09-01), Kajigaya et al.
patent: 5251095 (1993-10-01), Miller et al.
patent: 5271019 (1993-12-01), Edwards et al.
patent: 5301156 (1994-04-01), Talley
patent: 5326428 (1994-07-01), Farnworth et al.
patent: 5388104 (1995-02-01), Shirotori et al.
patent: 5418452 (1995-05-01), Pyle
patent: 5457400 (1995-10-01), Ahmad et al.
patent: 5477545 (1995-12-01), Huang
patent: 5479105 (1995-12-01), Kim et al.
patent: 5499250 (1996-03-01), Ingalls et al.
patent: 5506499 (1996-04-01), Puar
patent: 5523697 (1996-06-01), Farnworth et al.
patent: 5535165 (1996-07-01), David et al.
patent: 5594694 (1997-01-01), Roohparvar
patent: 5604432 (1997-02-01), Moore et al.
patent: 5619461 (1997-04-01), Roohparvar
patent: 5657284 (1997-08-01), Beffa
patent: 5677885 (1997-10-01), Roohparvar
patent: 5719438 (1998-02-01), Beilstein et al.
patent: 5751015 (1998-05-01), Corbett et al.
patent: 5751987 (1998-05-01), Mahant-Shetti et al.
patent: 5801452 (1998-09-01), Farnworth et al.
patent: 5805609 (1998-09-01), Mote, Jr.
patent: 5807762 (1998-09-01), Akram et al.
patent: 5825697 (1998-10-01), Gilliam et al.
patent: 5825782 (1998-10-01), Roohparvar
patent: 5923600 (1999-07-01), Momohara
patent: 5925142 (1999-07-01), Raad et al.
patent: 5936260 (1999-08-01), Corbett et al.
patent: 5959310 (1999-09-01), Akram et al.
patent: 5966388 (1999-10-01), Wright et al.
patent: 5995379 (1999-11-01), Kyougoku et al.
patent: 6011720 (2000-01-01), Tanaka
patent: 6026039 (2000-02-01), Kim et al.
patent: 6047393 (2000-04-01), Yamada
patent: 6069483 (2000-05-01), Maxwell et al.
patent: 6072326 (2000-06-01), Akram et al.
patent: 6087676 (2000-07-01), Akram et al.
patent: 6100708 (2000-08-01), Mizuta
patent: 6100716 (2000-08-01), Adham et al.
patent: 6104658 (2000-08-01), Lu
patent: 6104664 (2000-08-01), Ohno
patent: 6137167 (2000-10-01), Ahn et al.
patent: 6154860 (2000-11-01), Wright et al.
patent: 6157046 (2000-12-01), Corbett et al.
patent: 6188232 (2001-02-01), Akram et al.
patent: 6191603 (2001-02-01), Muradali et al.
patent: 6194738 (2001-02-01), Debenham et al.
patent: 6208157 (2001-03-01), Akram et al.
patent: 6216241 (2001-04-01), Fenstermaker et al.
patent: 6243839 (2001-06-01), Roohparvar
patent: 6243840 (2001-06-01), Raad et al.
patent: 6263463 (2001-07-01), Hashimoto
patent: 6274937 (2001-08-01), Ahn et al.
patent: 6286115 (2001-09-01), Stubbs
patent: 6294839 (2001-09-01), Mess et al.
patent: 6298001 (2001-10-01), Lee et al.
patent: 6298429 (2001-10-01), Scott et al.
patent: 6300782 (2001-10-01), Hembree et al.
patent: 6310484 (2001-10-01), Akram et al.
patent: 6320201 (2001-11-01), Corbett et al.
patent: 6351681 (2002-02-01), Chih et al.
patent: RE37611 (2002-03-01), Roohparvar
patent: 6365421 (2002-04-01), Debenham et al.
patent: 6366487 (2002-04-01), Yeom
patent: 6392948 (2002-05-01), Lee
patent: 6395565 (2002-05-01), Akram et al.
patent: 6396291 (2002-05-01), Akram et al.
patent: 6407566 (2002-06-01), Brunelle et al.
patent: 6441479 (2002-08-01), Ahn et al.
patent: 6445625 (2002-09-01), Abedifard
patent: 6456099 (2002-09-01), Eldridge et al.
patent: 6470484 (2002-10-01), Day et al.
patent: 6472747 (2002-10-01), Bazarjani et al.
patent: 6483760 (2002-11-01), Kang
patent: 6484279 (2002-11-01), Akram
patent: 6502215 (2002-12-01), Raad et al.
patent: 6507885 (2003-01-01), Lakhani et al.
patent: 6519171 (2003-02-01), Matsuzaki et al.
patent: 6519725 (2003-02-01), Huisman et al.
patent: 6675269 (2004-01-01), Miura et al.
patent: 6708264 (2004-03-01), Abe et al.
patent: 6711042 (2004-03-01), Ishikawa
patent: 6791175 (2004-09-01), Matsuo et al.
patent: 6801461 (2004-10-01), Hii et al.
patent: 6825683 (2004-11-01), Berndt et al.
patent: 6996754 (2006-02-01), Lee
patent: 2002/0017720 (2002-02-01), Nishizawa et al.
patent: 2002/0117729 (2002-08-01), Aiki et al.
patent: 2003/0235929 (2003-12-01), Cowles et al.
patent: 2004/0027150 (2004-02-01), Miura et al.
patent: 2004/0100296 (2004-05-01), Ong
patent: 2004/0150089 (2004-08-01), Inoue et al.
patent: 2004/0196709 (2004-10-01), Ong
patent: 2004/0232559 (2004-11-01), Adelmann

Affiliated with

Also associated with

Rating

Internally generating patterns for testing in an integrated... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Internally generating patterns for testing in an integrated..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Internally generating patterns for testing in an integrated... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3872705