Internal cache for on chip test data storage

Details Internal cache for on chip test data storage Internal cache for on chip test data storage

2005-05-31

2005-05-31

Dildine, R. Stephen (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S723000, C714S736000, C714S738000

Reexamination Certificate

active

06901542

ABSTRACT:
A method of testing a semiconductor device having a memory is disclosed. The method includes selecting a portion of the memory; testing the selected portion of the memory; designating the selected portion of the memory as a designated memory in response to an acceptable testing result; and storing data in the designated portion of the memory for retrieval at a later time. Provision for soft repair of the selected memory is made. Test data can be compressed before being stored in the designated memory.

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