Integrated semiconductor memory

Details Integrated semiconductor memory Integrated semiconductor memory

2007-04-17

2007-04-17

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S704000

Reexamination Certificate

active

11123221

ABSTRACT:
An integrated semiconductor memory includes a memory cell array with at least one memory cell, in which a data value is stored, and an evaluation circuit with a counter. During a test of the integrated semiconductor memory, a counter reading of the counter is altered if the data value stored in the memory cell deviates from a desired value. A threshold value is predefined by a control circuit. A programming circuit compares the threshold value on the input side with the instantaneous counter reading of the counter. If the counter reading of the counter exceeds the threshold value, a programming element changes from a first programming state to a second programming state. After the conclusion of the test, the state of the programming element is read out via an output terminal. This scheme makes it possible to deduce a possible cause of failure of the integrated semiconductor memory.

REFERENCES:
patent: 5640354 (1997-06-01), Jang et al.
patent: 6295237 (2001-09-01), Pochmuller
patent: 6539506 (2003-03-01), Lammers et al.
patent: 6684353 (2004-01-01), Parker et al.
patent: 6829181 (2004-12-01), Seitoh

Affiliated with

Also associated with

Rating

Integrated semiconductor memory does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated semiconductor memory, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated semiconductor memory will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3722919