Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2007-03-27
2007-03-27
Britt, Cynthia (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S042000
Reexamination Certificate
active
10908716
ABSTRACT:
A loop-back extender card is plugged into a memory module socket on a personal computer (PC) motherboard. The extender card has a test socket that receives a memory module under test. An Advanced Memory Buffer (AMB) on the memory module fully buffers DRAM chips on the memory module. The AMB inputs from and outputs to the test socket differential northbound lanes (toward a processor) and southbound lanes (away from the processor). The extender card has northbound loopback traces that connect northbound lane outputs from the memory module back to northbound-lane inputs to the memory module. Southbound loopback traces connect southbound lane outputs from the memory module back to southbound-lane inputs to the memory module. The loop-back extender card allows the AMB to perform loopback testing without modifying the PC motherboard. Series/shunt resistors can be placed on the loopback traces, or serpentine traces can be used to increase loopback delays.
REFERENCES:
patent: 5524232 (1996-06-01), Hajeer
patent: 6317352 (2001-11-01), Halbert et al.
patent: 6493250 (2002-12-01), Halbert et al.
patent: 7117405 (2006-10-01), Co et al.
patent: 2004/0105292 (2004-06-01), Matsui
patent: 2004/0216011 (2004-10-01), Co et al.
patent: 2004/0256638 (2004-12-01), Perego et al.
patent: 2005/0010737 (2005-01-01), Ware et al.
patent: 2005/0080581 (2005-04-01), Zimmerman et al.
patent: 2005/0098881 (2005-05-01), Perner
patent: 2005/0246594 (2005-11-01), Co et al.
patent: 2006/0282722 (2006-12-01), Co et al.
patent: 10042620 (2002-03-01), None
patent: 010345980 (2003-10-01), None
US 6,832,284, 12/2004, Perego et al. (withdrawn)
“Embedded Test for a New Memory-Card Architecture” by Resnick Test Conference, 2004. Proceedings. ITC 2004. International Publication Date: Oct. 26-28, 2004 On pp. 875-882 ISBN: 0-7803-8580-2 INSPEC Accession No. 8291777.
DDR2 SDRAM FBDIMM MT9HTF3272F, MT9HTF12872F data sheet, Rev A Micron Technology, Apr. 2005, pp. 1-36.
Co Ramon S.
Lai Tat Leung
Auvinen Stuart T.
Britt Cynthia
g Patent LLC
Kingston Technology Corp.
LandOfFree
Loop-Back Memory-Module Extender Card for Self-Testing... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Loop-Back Memory-Module Extender Card for Self-Testing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Loop-Back Memory-Module Extender Card for Self-Testing... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3730266