Integrated scannable interface for testing memory

Details Integrated scannable interface for testing memory Integrated scannable interface for testing memory

2006-06-09

2009-02-24

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S005110, C714S042000, C714S726000, C714S727000, C714S729000, C714S735000, C714S736000, C714S742000, C365S201000

Reexamination Certificate

active

07496809

ABSTRACT:
An integrated scannable interface for testing memory. The interface includes a selection device for selecting a signal from at least two input signals responsive to an activation signal, a first storage device coupled to the output of the selection device for storing the signal responsive to a first enable signal and generating an output signal for the memory. The first storage device is connected at the input node of the memory, and a second storage device is coupled at its input to the first storage device for storing the output signal responsive to a second enable signal and generating a test signal for testing the memory. The output signal is observed for debugging faults between the integrated scannable interface and the memory and for debugging faults between the first and second storage devices.

REFERENCES:
patent: 5115191 (1992-05-01), Yoshimori
patent: 5175447 (1992-12-01), Kawasaki et al.
patent: 5175494 (1992-12-01), Yoshimori
patent: 6044481 (2000-03-01), Kornachuk et al.
patent: 6275963 (2001-08-01), Maeno et al.
patent: 6308290 (2001-10-01), Forlenza et al.
patent: 6651196 (2003-11-01), Iwase et al.
patent: 7145818 (2006-12-01), Fukuoka et al.
patent: 7263679 (2007-08-01), Kuge et al.
patent: 7315971 (2008-01-01), Grose et al.
patent: 2002/0194558 (2002-12-01), Wang et al.

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