Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2008-06-16
2011-10-25
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S710000
Reexamination Certificate
active
08046645
ABSTRACT:
A bad block identifying method for a flash memory, a storage system, and a controller thereof are provided. The bad block identifying method includes determining whether a programming error occurs in a block of the flash memory after the block is programmed and marking the block as a bad block when the programming error successively occurs in the block. Since the block is determined to be a bad block only when the programming error repeatedly occurs in the block, misjudgment of bad block in the flash memory can be avoided and accordingly the lifespan of the flash memory storage system can be prolonged.
REFERENCES:
patent: 5513144 (1996-04-01), O'Toole
patent: 5546402 (1996-08-01), Niijima et al.
patent: 5577194 (1996-11-01), Wells et al.
patent: 5648934 (1997-07-01), O'Toole
patent: 5954828 (1999-09-01), Lin
patent: 6014755 (2000-01-01), Wells et al.
patent: 7447936 (2008-11-01), Shiota et al.
patent: 2005/0283647 (2005-12-01), Ishidoshiro et al.
patent: 2006/0080515 (2006-04-01), Spiers et al.
patent: 2008/0049504 (2008-02-01), Kasahara et al.
patent: 2008/0209282 (2008-08-01), Lee et al.
patent: 2008/0307270 (2008-12-01), Li
patent: 2009/0055680 (2009-02-01), Honda et al.
Sun, F.; Devarajan, S.; Rose, K.; Zhang, T.; , “Design of on-chip error correction systems for multilevel NOR and NAND flash memories,” Circuits, Devices & Systems, IET , vol. 1, No. 3, pp. 241-249, Jun. 2007 doi: 10.1049/iet-cds:20060275 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4273065&isnumber=4273056.
Hsu Chih-Jen
Huang Yi-Hsiang
Britt Cynthia
J.C. Patents
Phison Electronics Corp.
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