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Chip carrier socket test probe

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Chip carrier to allow electron beam probing and FIB modification

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Chip carrier to allow electron beam probing and fib...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chip partitioning aid (CPA)-A structure for test pattern generat

Electricity: measuring and testing – Plural – automatically sequential tests
Patent

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Chip pin test apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chip scale electrical test fixture

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Chip scale electrical test fixture with isolation plate...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chip socket testing apparatus with adjustable contact force

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Chip test apparatus and probe card circuit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chip tester for testing validity of a chipset

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chip tester having a heat-exchanger with an extendable...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chip tester with improvements in handling efficiency and measure

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Chip testing machine with rotary conveying disk set for...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chip-based prober for high frequency measurements and...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chip-detector assembly having improved probe-retention features

Electricity: measuring and testing – Magnetic – Fluid material examination
Reexamination Certificate

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Chip-lifetime testing instrument for semiconductor devices

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Chip-mounted contact springs

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chip-on-chip testing using BIST

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chip-scale package for integrated circuits

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chip-type sensor against ESD and stress damages and...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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