Chip-lifetime testing instrument for semiconductor devices

Details Chip-lifetime testing instrument for semiconductor devices Chip-lifetime testing instrument for semiconductor devices

1991-10-17

1994-03-01

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158P, G01R 3128, G01R 3102

Patent

active

052911276

ABSTRACT:
A chip-lifetime testing instrument for semiconductor devices which can detect defective chips by testing the performance and electrical lifetime of the chips in manufacturing process of the semiconductor devices, so that the manufacturing cost can be reduced and unnecessary processes for packaging of defective chips can be avoided, thereby reducing the necessary space for the set-up of the testing instrument.

REFERENCES:
patent: 3702439 (1972-11-01), McGahey et al.
patent: 4161692 (1979-07-01), Tarzwell
patent: 4677474 (1987-06-01), Sato et al.
patent: 4820975 (1989-04-01), Diggle
patent: 4870355 (1989-09-01), Kufis et al.
patent: 4943767 (1990-07-01), Yokota
patent: 5055778 (1991-10-01), Okubo et al.

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