Chip test apparatus and probe card circuit

Details Chip test apparatus and probe card circuit Chip test apparatus and probe card circuit

2008-05-19

2010-10-12

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07812625

ABSTRACT:
A circuit in probe card, which includes a signal line, a detection probe and a plurality of switch modules. A plurality of test response signals form a plurality of chips to be tested are transmitted on the signal line. The detection probe is coupled to the signal line for receiving the test response signals from the tested chips. In addition, each of the switch modules is respectively coupled to the signal line and the probes to selectively transmit the test response signals from the chips to the signal line such that the chips are able to be tested without disruption caused by an electrical short.

REFERENCES:
patent: 5550480 (1996-08-01), Nelson et al.
patent: 6339338 (2002-01-01), Eldridge et al.
patent: 6445207 (2002-09-01), Kamimura
patent: 7245120 (2007-07-01), Eldridge et al.
patent: 7262613 (2007-08-01), Komatsu et al.

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