Chip carrier socket test probe

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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Details

324 725, 324158F, 439330, G01R 100, G01R 102

Patent

active

049789120

ABSTRACT:
A test probe for use with a chip carrier socket including electrical connections to an external testing device and contacts to engage matching contacts within the chip socket. Tong-like elements grasp the socket to insure both mechanical and electrical integrity of the connections. A slip ring retains the tongs and probe in operated position.

REFERENCES:
patent: 4012097 (1977-03-01), Long et al.
patent: 4055800 (1977-10-01), Fisk et al.
patent: 4767985 (1988-08-01), Shearer, Jr. et al.
patent: 4768972 (1988-09-01), Ignasiak et al.
patent: 4835469 (1989-05-01), Jones et al.

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