Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-11-29
2005-11-29
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090, C324S1540PB
Reexamination Certificate
active
06970008
ABSTRACT:
A chip testing machine includes a testing mechanism for acquiring data of chips and sorting same into several different groups according to outcome of testing operation, a feeding mechanism for helping convey chips to the testing mechanism, and a second rotary conveying disk in addition to a first rotary conveying disk for helping increase efficiency of testing; the first and the second disks are juxtaposed, actuated to rotate synchronously in opposite directions by means of single common transmission device to receive chips conveyed from the feeding mechanism as well as to convey the chips to the testing mechanism for testing, and cooperate with respective delivering mechanisms for conveying chips to collecting sinks designated for respective ones of the different groups of chips after the chips have been tested.
REFERENCES:
patent: 5451884 (1995-09-01), Sauerland
patent: 6218852 (2001-04-01), Smith et al.
patent: 6710613 (2004-03-01), Sauerland
All Ring Tech Co., Ltd.
Patel Paresh
Rosenberg , Klein & Lee
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