Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-01-15
2008-01-15
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
07319338
ABSTRACT:
A chip tester is mounted on a circuit board for testing validity of a chipset includes a base member that receives the chipset thereon and that has a plurality of testing contacts in electrical communication with the circuit board and, and a top cover that is mounted on the base member to confine the chipset therebetween and has a test opening for access to the chip set. When the chipset is confined between the top cover and the base member, electrical contacts of the chipset are in contact with the testing contacts in the base member.
REFERENCES:
patent: 5801441 (1998-09-01), DiStefano et al.
patent: 6441630 (2002-08-01), Obikane et al.
patent: 2002/0137369 (2002-09-01), Edwards et al.
patent: 2003/0134526 (2003-07-01), Cheng et al.
Birch & Stewart Kolasch & Birch, LLP
Tang Minh N.
VIA Technologies Inc.
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