Chip tester having a heat-exchanger with an extendable...

Details Chip tester having a heat-exchanger with an extendable... Chip tester having a heat-exchanger with an extendable...

2005-07-05

2005-07-05

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06914446

ABSTRACT:
A chip tester includes a heat-exchanger which regulates the temperature of an integrated circuit chip that is being tested by pressing against the chip. The heat-exchanger incorporates an electric heater and a heatsink that are joined together with a layer of attach material. The layer of attach material is limited to one that can be melted, at least partially, at a predetermined temperature, and re-solidified, multiple times. A spacer is in the heat-exchanger which stays solid at the predetermined temperature and which keeps the layer of attach material at a constant thickness.

REFERENCES:
patent: 4297775 (1981-11-01), Butt et al.
patent: 5821505 (1998-10-01), Tustaniwskyj et al.
patent: 5864176 (1999-01-01), Babock et al.
patent: 6636062 (2003-10-01), Gaasch et al.

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