Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-06-07
2011-06-07
Nguyen, Ha Tran T (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07956628
ABSTRACT:
A chip-based prober for measuring a device-under-test is provided. The prober includes a probe tip, a voltage and control connector, a chip carrier, and a programmable termination chip. The probe tip is configured to contact the device-under-test. The voltage and control connector is in electrical communication with the probe tip. The programmable termination chip has a plurality of terminations interconnected with the voltage and control connector and the chip carrier through controlled collapsed chip connections.
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Application No. 200710167615.3, Filing Date: Oct. 23, 2007, Applicant: Edward R. Pillai, et al., 1st Office Action.
Office Action dated Feb. 9, 2011 corresponding to Chinese Patent Application No. 100022 (with English abstract).
Breiland Erik J.
Pfeiffer Ullrich R.
Pillai Edward R.
Abate, IBM Atty. Joseph P.
International Business Machines - Corporation
Nguyen Ha Tran T
Nguyen Tung X
Ohlandt Greeley Ruggiero & Perle LLP
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