Chip pin test apparatus

Details Chip pin test apparatus Chip pin test apparatus

2011-01-18

2011-01-18

Nguyen, Ha Tran T (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07872484

ABSTRACT:
A test apparatus includes a printed circuit board, a chip carrier socket, and a display circuit. The chip carrier socket includes a space to receive a chip including a plurality of pins, a plurality of contact terminals, and a grounded ground portion. The display circuit includes a power supply and a plurality of light-emitting elements. When the chip is received in the space, the ground portion contacts a middle portion of each pin. When a pin of the chip is normal, a distal end of the normal pin contacts a corresponding contact terminal to connect a corresponding light-emitting element to the ground portion, causing the light-emitting element to light up. When a pin of the chip is askew, a distal end of the askew pin cannot contact a corresponding contact terminal, the corresponding light-emitting element will not light up.

REFERENCES:
patent: 6285200 (2001-09-01), Pace et al.
patent: 6384377 (2002-05-01), Komuro
patent: 6703851 (2004-03-01), Howell
patent: 6879173 (2005-04-01), Barr et al.
patent: 2007/0057683 (2007-03-01), Abe

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