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Techniques for automatically generating tests for...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Techniques for filtering systematic differences from wafer...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test access port

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test and measurement instrument having multi-channel...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test apparatus

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test apparatus

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test apparatus and program therefor

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test apparatus and program therefor

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test apparatus and setting method therefor

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test apparatus and test method

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test apparatus and test method for mixed-signal...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test apparatus, and control method

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test apparatus, diagnosing program and diagnosing method...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test architecture for microcontroller providing for a serial...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test automation method and tool with dynamic attributes and...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test bit-stream generator and method for decoders

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test circuit and semiconductor integrated circuit...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test circuit for performing multiple test modes

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test device for dynamic memory modules

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Test equipment, method for loading test plan and program...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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