Test apparatus and program therefor

Details Test apparatus and program therefor Test apparatus and program therefor

2005-04-27

2008-03-11

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

07343259

ABSTRACT:
There is provided a test apparatus having a plurality of test modules for supplying test patterns used in testing devices under test to the devices corresponding to a given timing signal, a reference clock generating section for generating a reference clock, a plurality of timing supply sections, provided corresponding to the plurality of test modules, for generating the timing signal corresponding to the reference clock and supplying the timing signal to the corresponding test module, respectively, and a control section for controlling timing for outputting the timing signal output by the timing supply section so that timing of the respective test patterns output by the plurality of test modules is practically equalized based on a test module delay of each test module until when it outputs the test pattern after receiving the timing signal.

REFERENCES:
patent: 2002/0049554 (2002-04-01), Miller
patent: 2003/0101015 (2003-05-01), Douskey et al.
patent: 10-19980 (1998-01-01), None
patent: 11-190760 (1999-07-01), None
patent: 2000-131388 (2000-05-01), None
patent: 2000-147069 (2000-05-01), None
patent: 2002-139556 (2002-05-01), None
patent: 2003-156527 (2003-05-01), None
patent: 2004-212291 (2004-07-01), None
patent: 2005-91038 (2005-04-01), None
International Search Report issued in International Appl. No. PCT/JP2006/308327 mailed on Jul. 4, 2006, 3 pages.

Affiliated with

Also associated with

Rating

Test apparatus and program therefor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test apparatus and program therefor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test apparatus and program therefor will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3960507