Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-12-18
2010-11-23
Feliciano, Eliseo Ramos (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S078000, C702S110000, C702S117000
Reexamination Certificate
active
07840368
ABSTRACT:
A test circuit includes a first reset pulse generator configured to generate a first reset pulse when a test mode is performed or when power is up, a test mode maintenance signal generator configured to provide a test mode maintenance signal activated in response to a predetermined consecutive test information data, the activation of the test mode maintenance signal being controlled by the first reset pulse, a second reset pulse generator configured to generate a second reset pulse when the test information data is received as a predetermined test mode reset data or when power is up, and a test mode selection signal generator configured to receive the test information data provided from the test mode maintenance signal generator and the test mode maintenance signal and to generate a specific test mode selection signal, the activation of the specific test mode selection signal being controlled by the second reset pulse.
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Baker & McKenzie LLP
Feliciano Eliseo Ramos
Henson Mi'schita'
Hynix / Semiconductor Inc.
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