Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-01-02
2007-01-02
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S121000, C702S183000, C714S025000
Reexamination Certificate
active
11137861
ABSTRACT:
There is provided a test apparatus having a plurality of test modules. The test apparatus stores object diagnosing programs for controlling diagnosis of the object test module to be diagnosed of a certain type per type of the test module to be diagnosed and stores, separately from it, a set of identification information of diagnostic performance board to be mounted on a test head to diagnose the object test module to be diagnosed by the respective object diagnosing programs per type of the object test modules to be diagnosed. When the diagnostic performance board is mounted on the test head, the test apparatus obtains identification information of the diagnostic performance board and executes the object diagnosing program corresponding to that type under the condition that the identification information coincides with the identification information stored correlatively with the type of the designated object test module to be diagnosed.
REFERENCES:
patent: 5036479 (1991-07-01), Prednis et al.
patent: 5357519 (1994-10-01), Martin et al.
patent: 6-281692 (1994-10-01), None
patent: 10-150082 (1998-06-01), None
patent: 11-304880 (1999-11-01), None
patent: 2002-174674 (2002-06-01), None
Semiconductor Test Consortium, “STC Announces Public Access to the Openstar™ Specs,” [online], Dec. 7, 2004, URL: http://www.semitest.org/site/News/STC—Spec—Open—to—Public>, printed May 13, 2005, 1 page.
International Search Report for Application No. PCT/JP2006/308234, dated Jul. 25, 2006 (3 pages).
Written Opinion for Application No. PCT/JP2006/308234, dated Jul. 25, 2006 (3 pages).
Patent Abstracts of Japan; English Translation of Publication No. 11-304880 dated May 11, 1999.
Patent Abstracts of Japan; English Translation of Publication No. 10/150082 dated Feb. 6, 1998.
Patent Abstracts of Japan; English Translation of Publication No. 06/281692 dated Jul. 10, 1994.
Advantest Corporation
Barlow John
Le John
Osha & Liang LLP
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