Test apparatus

Details Test apparatus Test apparatus

2008-09-29

2011-12-13

Feliciano, Eliseo Ramos (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S121000, C702S122000, C702S123000, C702S124000

Reexamination Certificate

active

08078424

ABSTRACT:
Provided is a test apparatus10, which includes: a plurality of test modules150, each of which is connected to any of the plurality of devices under test100to supply a test signal to the connected device under test100; a plurality of site controllers130that control the plurality of test modules150to test the respective plurality of devices under test100simultaneously; a connection setting device140that sets a connection mode between the plurality of site controllers130and the plurality of test modules150so that each of the test modules150is connected to any of the plurality of site controllers130; and a plurality of system controllers110, each of which controls any of the plurality of site controllers130, in which a predetermined system controller of the plurality of system controllers110assigns, in response to a request from another system controller of the system controllers, a site controller of the site controllers, which is to be controlled by the another system controller.

REFERENCES:
patent: 4403297 (1983-09-01), Tivy
patent: 4807161 (1989-02-01), Comfort et al.
patent: 5025205 (1991-06-01), Mydill et al.
patent: 7184917 (2007-02-01), Pramanick et al.
patent: 3-128473 (1991-05-01), None

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