Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-01-16
2007-01-16
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
Reexamination Certificate
active
10159849
ABSTRACT:
A test device for dynamic memory modules is described and has an electronic test unit for generating test signals. Accordingly, the electronic test unit has at least one electronic component for generating the test signals, and is configured for use on a personal computer mother board and contains at least one memory controller.
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Merriam Webster's Collegiate Dictionary, Tenth Edition, 1997, p. 867.
Georg Schnurer: “Setup-Guide, Wegweiser durchs Motherboard-BIOS, Teil 1” [setup-guide, guide through the motherboard BIOS, part 1],c't, 1997, No. 3, pp. 344-353.
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Greenbe Laurence A.
Infineon - Technologies AG
Locher Ralph E.
Nghiem Michael
Stemer Werner H.
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