Test device for dynamic memory modules

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Reexamination Certificate

active

10159849

ABSTRACT:
A test device for dynamic memory modules is described and has an electronic test unit for generating test signals. Accordingly, the electronic test unit has at least one electronic component for generating the test signals, and is configured for use on a personal computer mother board and contains at least one memory controller.

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patent: 2002/0056057 (2002-05-01), Co
patent: 2002/0173926 (2002-11-01), McCord
patent: 196 25 876 (1998-01-01), None
patent: 2002014031 (2002-02-01), None
Merriam Webster's Collegiate Dictionary, Tenth Edition, 1997, p. 867.
Georg Schnurer: “Setup-Guide, Wegweiser durchs Motherboard-BIOS, Teil 1” [setup-guide, guide through the motherboard BIOS, part 1],c't, 1997, No. 3, pp. 344-353.
Hans-Peter Messmer: “PC-Hardwarebuch” [PC hardware book],Addison-Wesley-Longman, Bonn, 5thed., 1998, pp. 480-481.
Andreas Stiller: “DIMM-Tester, Optimum SD-DIMM Tester von Madex” [DIMM tester, optimum SD-DIMM tester by Madex],c't, 1999, No. 21, p. 112.

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