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Late binding of variables during test case generation for...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Latent fault detection in redundant power supply systems

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Low circuit overhead built in self test for oversampled ADC's

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Low cost test for IC's or electrical modules using standard...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Low cost, highly parallel memory tester

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Patent

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Low-impact analyzer interface

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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