Test apparatus and test method for mixed-signal...

Details Test apparatus and test method for mixed-signal... Test apparatus and test method for mixed-signal...

2007-04-17

2007-04-17

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

11395528

ABSTRACT:
A semiconductor component is tested by providing a tester, a loadboard and an evaluation apparatus. The semiconductor component is operated using a test sequence, with the reference signal being applied to the semiconductor component or to the evaluation apparatus.

REFERENCES:
patent: 4937773 (1990-06-01), Mittermaier et al.
patent: 6587862 (2003-07-01), Henderson
patent: 2002/0198672 (2002-12-01), Jungerman et al.
patent: 2003/0030461 (2003-02-01), Oberle et al.
patent: 2005/0231228 (2005-10-01), Mattes
patent: WO 2005/012933 (2005-02-01), None
Anderson, Russell “Getting the Most out of Delta-Sigma Converters”, Texas Instruments Incorporated,Analog Zone, Apr. 2004.

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