Test apparatus and setting method therefor

Details Test apparatus and setting method therefor Test apparatus and setting method therefor

2006-09-12

2006-09-12

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S123000, C702S124000, C324S527000, C324S555000

Reexamination Certificate

active

07107172

ABSTRACT:
A test apparatus for testing an electric device includes a plurality of signal input-output units for inputting and/or outputting test signals in response to each of a plurality of terminals included by the electric device, a channel selection memory for storing pieces of channel selection information indicating whether each of the signal input-output units should perform setting based on a setting condition or not, a setting condition memory for storing the setting condition with regard to the signal input-output unit, and a controlling means for retrieving and supplying the setting condition stored in the setting condition memory and the channel selection information stored in the channel selection memory to the signal input-output units based on a setting instruction, when receiving the setting instruction to set the setting condition of the signal input-output unit, wherein when at least one of the signal input-output units is selected by the channel selection information supplied from the controlling means, the one of the signal input-output units is set based on the setting condition supplied from the controlling means.

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