Test equipment, method for loading test plan and program...

Details Test equipment, method for loading test plan and program... Test equipment, method for loading test plan and program...

2007-11-05

2010-10-05

Nghiem, Michael P (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

07809520

ABSTRACT:
Test equipment includes a memory to which a test plan that includes a plurality of sub-test plans is loaded and a system controller that, when the test equipment actually examines a device-under-test (DUT), loads the test plan to the memory by the unit of the sub-test plan and supplies a test signal to the DUT by interpreting the loaded test plan.

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patent: 2005/0154551 (2005-07-01), Pramanick et al.
patent: 2005/0262412 (2005-11-01), Mukai et al.
patent: 2008/0235550 (2008-09-01), Yamada et al.

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