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Same virtual machine mode for distributed test execution

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Scan chain disable function for power saving

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Scan test viewing and analysis tool

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Scan vector support for event based test system

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Screening optical transceiver modules for electrostatic...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Self-optimizing adjustment algorithm

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Self-test architecture to implement data column redundancy...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Self-test circuit for high-definition multimedia interface...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Self-test with split, asymmetric controlled driver output stage

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Self-testing of smart line cards

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device and semiconductor device testing method

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device and testing circuit which can carries...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device capable of test mode operation

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device fabrication method

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device having a mode of functional test

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device having a test circuit for testing an...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device having a test circuit for testing an...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device having selectable device type and...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device having self test function

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor device tester and its method

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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