Identifying manufacturing disturbances using preliminary...
Impedance spectroscopy measurement system
In-system testing of an oscillator
Indirect techniques for measuring 1/f noise
Input-output circuit and a testing apparatus
Instruction register and access port gated clock for scan cells
Instrument architecture with circular processing queue
Instrument ring architecture for use with a multi-core...
Integrated circuit and method for determining the operating...
Integrated circuit and the corresponding test method,...
Integrated circuit characterisation system and method
Integrated circuit device having a test circuit to measure...
Integrated circuit tester including at least one quasi-autonomou
Integrated circuit tester with real time branching
Integrated circuit testing method, program, storing medium,...
Integrated circuit with bit error test capability
Integrated circuit with parameter measurement
Integrated stepwise statistical process control in a plasma...
Interface for managing test definitions
Internal bias measure with onboard ADC for electronic devices