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Technology migration for integrated circuits with radical...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Technology migration for integrated circuits with radical...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Technology migration for integrated circuits with radical...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Temperature programmable timing delay system

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Template-based simulated annealing move-set that improves...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Temporal decomposition for design and verification

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing
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Temporal replicant simulation

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing
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Test circuit inserting method and apparatus for a...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Test generation for analog circuits using partitioning and...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Test interface for a configurable system on-chip

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Test ket layout for precisely monitoring 3-foil lens...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Test masks for lithographic and etch processes

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Test method and system for characterizing and/or refining an...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
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Test method for unit re-modification

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Optimization
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Test structure for automatic dynamic negative-bias...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Test structures and method for interconnect impedance...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Test structures and method for interconnect impedance...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Test structures for estimating dishing and erosion effects...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Test structures for feature fidelity improvement

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Test yield estimate for semiconductor products created from...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Yield
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