Test method for unit re-modification

Details Test method for unit re-modification Test method for unit re-modification

2011-04-19

2011-04-19

Siek, Vuthe (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Integrated circuit design processing

Optimization

C716S111000, C716S136000

Reexamination Certificate

active

07930671

ABSTRACT:
The present invention described a test method for unit re-modification, in which there is a test end and a host end. The method generated a sample pattern at a test end, generates a control pattern and modifies a re-modification unit. Otherwise, an experimental pattern is generated and then whether or not the original function is retained after modifying the re-modification unit is determined according to the result of comparison of the control pattern and experimental pattern thereon. The present invention is used to test the internal function module of specific software or hardware, and ensure that the proper function is retained after re-modification.

REFERENCES:
patent: 6825887 (2004-11-01), Miller et al.
patent: 2005/0160338 (2005-07-01), Hapke

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