Fabrication method for a semiconductor device with dummy...
Fabrication method for semiconductor device, exposure...
Facilitating high-level validation of integrated circuits in...
Facilitating press operation in abutted-pin hierarchical...
Facilitating structural coverage of a design during design...
Facilitating verification in abutted-pin hierarchical...
Fail-safe thermal sensor apparatus and method
Failure analyzing apparatus and failure analyzing method for...
Failure analyzing method and apparatus using two-dimensional...
Failure detection improvement apparatus, failure detection...
Failure path grouping method, apparatus, and...
False path detecting apparatus and a false path detecting...
Fanout-optimization during physical synthesis for placed...
Fast algorithm to extract flat information from hierarchical...
Fast and accurate optical proximity correction engine for...
Fast dual- V dd buffer insertion and buffered tree...
Fast evaluation of average critical area for IC layouts
Fast evaluation of average critical area for IC layouts
Fast evaluation of average critical area for IC layouts
Fast evaluation of average critical area for ic layouts