Techniques for using edge masks to perform timing analysis
Techniques for using edge masks to perform timing analysis
Technology dependent transformations for...
Technology mapping method and storage medium
Technology mapping technique for fracturable logic elements
Technology mapping techniques for incomplete lookup tables
Technology migration for integrated circuits with radical...
Technology migration for integrated circuits with radical...
Technology migration for integrated circuits with radical...
Temperature programmable timing delay system
Template-based simulated annealing move-set that improves...
Test circuit inserting method and apparatus for a...
Test generation for analog circuits using partitioning and...
Test interface for a configurable system on-chip
Test ket layout for precisely monitoring 3-foil lens...
Test masks for lithographic and etch processes
Test structure for automatic dynamic negative-bias...
Test structures and method for interconnect impedance...
Test structures and method for interconnect impedance...
Test structures for estimating dishing and erosion effects...