Identifying semiconductor system specification violations

Details Identifying semiconductor system specification violations Identifying semiconductor system specification violations

2010-10-19

2011-10-11

Chiang, Jack (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Integrated circuit design processing

Testing or evaluating

C703S002000

Reexamination Certificate

active

08037447

ABSTRACT:
A method for identifying specification window violations for a system is described. The method includes generating a sample set of input parameters. The system is simulated using the sample set to generate an output set. A mathematical model is best-fit to the output set. A set of desirability functions is defined to an out-of-spec condition. The model is then searched using the desirability functions to identify a worst-case data point. The worst-case data point can then be determined as either being within specification or out of specification.

REFERENCES:
patent: 6356861 (2002-03-01), Singhal et al.
patent: 2004/0034838 (2004-02-01), Liau

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