Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
Reexamination Certificate
2011-07-19
2011-07-19
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Testing or evaluating
C716S108000
Reexamination Certificate
active
07984412
ABSTRACT:
A method (100) of estimating a performance characteristic of an integrated circuit (IC) design having an intellectual property (“IP”) core pre-characterizes an element type of the IC design to provide an estimation result of the element type (102-108). Mid-level elements of the IP are acquired (116). A user selects a value of a parameter of the IP core and the IC design is run on a design tool using the estimation result to model the mid-level elements of the IP core (118) to return a performance value of the IC design (120).
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Arndt Christopher S.
Schumacher Paul R.
Cartier Lois D.
Chiang Jack
Hewett Scott
Maunu LeRoy D.
Tat Binh C
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