Characterization and reduction of variation for integrated...

Details Characterization and reduction of variation for integrated... Characterization and reduction of variation for integrated...

2011-08-16

2011-08-16

Whitmore, Stacy A (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Integrated circuit design processing

Testing or evaluating

C716S100000, C716S110000, C716S132000

Reexamination Certificate

active

08001516

ABSTRACT:
A method and system are described to reduce process variation as a result of the semiconductor processing of films in integrated circuit manufacturing processes. The described methods use process variation and electrical impact to modify the design and manufacture of integrated circuits.

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