Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1997-11-06
2000-04-25
Picard, Leo P.
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
257778, 361777, 324754, 3241581, 324537, 174261, H01L 2358, G01R 2900
Patent
active
060547200
ABSTRACT:
A test vehicle for an SIR testing system is described. A circuit board having a plurality of interleaved circuit patterns is provided with replica components mounted thereon. The interleaved circuit patterns have different conductor spacings to permit a qualitative evaluation of electronic assembly manufacturing processes. The replica components have connection leads which are soldered to circuit pads on the circuit board. The circuit pads are connected into two groups which are used along with the interleaved circuit patterns to evaluate the manufacturing process using SIR measurements.
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IBM Technical Disclosure Bulletin, vol. 33, No. 10B, Mar. 1991.
Fieselman Charles David
Noreika Richard Joseph
Poole Joseph Donald
Duong Hung Van
International Business Machines - Corporation
Picard Leo P.
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