Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2008-01-29
2008-01-29
Nguyen, Tuan H. (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C324S765010
Reexamination Certificate
active
07323712
ABSTRACT:
An anisotropically conductive connector, by which positioning, and holding and fixing to a wafer to be inspected can be conducted with ease even when the wafer has a large area, contains a frame plate having a plurality of anisotropically conductive film-arranging holes formed corresponding to regions of electrodes to be inspected of a wafer, and a plurality of elastic anisotropically conductive films arranged in the respective anisotropically conductive film-arranging holes and supported by the inner peripheral edge thereabout.
REFERENCES:
patent: 6168442 (2001-01-01), Naoi
patent: 6204681 (2001-03-01), Nagatsuka et al.
patent: 6215321 (2001-04-01), Nakata
patent: 6394821 (2002-05-01), Matsumura et al.
patent: 6597192 (2003-07-01), Yamaguchi et al.
patent: 6663799 (2003-12-01), Kokubo et al.
patent: 6690564 (2004-02-01), Haruta et al.
patent: 6720787 (2004-04-01), Kimura et al.
patent: 2001/0049208 (2001-12-01), Igarashi et al.
patent: 2004/0028893 (2004-02-01), Inoue et al.
patent: 2004/0217342 (2004-11-01), Kokubo et al.
patent: 2006/0033100 (2006-02-01), Kokubo et al.
patent: 558855 (1993-09-01), None
patent: 11-204177 (1999-07-01), None
patent: 2000-353556 (2000-12-01), None
patent: 90/13992 (1990-11-01), None
patent: 02/065588 (2002-08-01), None
esp@cenet—English Abstract for JP11204177.
esp@cenet—English Abstract for JP2000353556.
esp@cenet—English Abstract of JP7231019.
esp@cenet—English Abstract of JP8005666.
U.S. Appl. No. 11/395,148, filed Apr. 3, 2006, Kokubo et al.
esp@cenet—English Abstract for JP11204177, 1999.
esp@cenet—English Abstract for JP20003535556, 2000.
esp@cenet—English Abstract of JP7231019, 1995.
esp@cenet—English Abstract of JP8005666, 1996.
Inoue Kazuo
Kokubo Terukazu
Naoi Masaya
Seno Koji
JSR Corporation
Nguyen Tuan H.
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
LandOfFree
Anisotropically conductive connector and production process... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Anisotropically conductive connector and production process..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Anisotropically conductive connector and production process... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2776793