Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1998-02-27
2000-10-24
Hardy, David
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
257500, 257506, 257369, H01L 2358, H01L 2900, H01L 2976, H01L 2994, H01L 31062
Patent
active
06137119&
ABSTRACT:
An integrated circuit includes an enable terminal, a semiconductor substrate, a conductive region, and a transistor. A substrate region is disposed within the substrate, and the conductive region is electrically isolated from both the substrate and the substrate region. The transistor includes a first terminal that is coupled to the substrate region, a second terminal that is coupled to the conductive region, and a control terminal that is coupled to the enable terminal.
REFERENCES:
patent: 4888631 (1989-12-01), Azuma et al.
patent: 5768195 (1998-06-01), Nakamura et al.
patent: 5869877 (1999-02-01), Patrick et al.
Bissey Lucien J.
Carson Bryan C.
Roberts Gordon D.
Fenty Jesse A
Hardy David
Micro)n Technology, Inc.
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