Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2005-05-31
2005-05-31
Smith, Matthew (Department: 2825)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C324S1540PB, C324S754090, C438S010000, C438S011000, C438S012000, C438S013000, C438S015000, C438S016000, C438S017000, C438S018000
Reexamination Certificate
active
06900459
ABSTRACT:
A method and apparatus of assembling and disassembling semiconductor dice to be tested from the components of a temporary test package. A computer-controlled vision system is employed to align the dice with the temporary test package bases, and an automated robot arm system is employed to retrieve and assemble the dice with the various package components. The invention has particular utility in the burn-in and other pre-packaging testing of dice to establish known good dice (KGD).
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Farnworth Warren M.
Folaron Jennifer L.
Folaron Robert J.
Hembree David R.
Jacobson John O.
Keshavan Belur
Micro)n Technology, Inc.
TraskBritt
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