LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Diffractometer data collecting method and apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Diffractord with doubly curved surface steps

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Digital lock-in detection of site-specific magnetism in...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Digital X-ray camera for quality evaluation...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Direct detection of x-rays for protein crystallography employing

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Direct structure determination of systems with two...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Double crystal analyzer linkage

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Doubly curved optical device with graded atomic planes

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Downhole imaging tool utilizing x-ray generator

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Drainage profile tester for papermaking

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Drive-through vehicle inspection system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Dual-wavelength x-ray monochromator

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Dual-wavelength X-ray reflectometry

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Efficient measurement of diffuse X-ray reflections

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Electromagnetic wave/particle beam spectroscopic method and...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Energy discriminating scatter imaging system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Energy dispersion x-ray fluorescence analysis of chemical...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Enhancement of X-ray reflectometry by measurement of diffuse...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Enhancing resolution of X-ray measurements by sample motion