X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2006-04-05
2008-12-16
Yun, Jurie (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S098800
Reexamination Certificate
active
07466798
ABSTRACT:
The present invention provides a digital topography imaging system for determining the crystalline structure of a biological macromolecule, wherein the system employs a charge coupled device (CCD) camera with antiblooming circuitry to directly convert x-ray signals to electrical signals without the use of phosphor and measures reflection profiles from the x-ray emitting source after x-rays are passed through a sample. Methods for using said system are also provided.
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Bellamy Henry
Borgstahl Gloria
Lovelace Jeff
Snell Edward Holmes
Dann Dorfman Herrall & Skillman, PC
Haun Niels
Regents of the University of Nebraska, Board of Varner Hall
Yun Jurie
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