X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2011-08-09
2011-08-09
Yun, Jurie (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S156000
Reexamination Certificate
active
07995706
ABSTRACT:
The present invention provides an electromagnetic wave/particle beam spectroscopic instrument that is not easily deteriorated in spectroscopic capability, and is resistant to electromagnetic noise, vibrations, heavy sound, heat and specific particle beams of interest, particle beams other than electromagnetic waves, electric noise due to electromagnetic waves, mechanical destruction, and recoiling of solid constituent atoms and is also more resistant to radiation exposure on the detection means than the conventional energy resolving technologies. A spectroscopic instrument10includes a Laplace transform filter11that performs Laplace transform on the intensity of an incident spectrum, a detection element15that detects a transmitted intensity of the incident spectrum, and an arithmetic device17that performs inverse Laplace transform on the detected transmitted intensity of the incident spectrum, thereby calculating the incident intensity of the incident spectrum that has entered the Laplace transform filter11.
REFERENCES:
patent: 58-27079 (1983-02-01), None
patent: 01-314988 (1989-12-01), None
Inter-University Research Institute Corporation National Institu
Workman Nydegger
Yun Jurie
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