Energy discriminating scatter imaging system

Details Energy discriminating scatter imaging system Energy discriminating scatter imaging system

2006-06-15

2010-06-15

Glick, Edward J (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S057000, C378S088000, C378S090000, C250S370090, C250S370130

Reexamination Certificate

active

07738631

ABSTRACT:
A specimen inspection system includes a photon source for outputting photons along a transmission path and a conveyor for translating a specimen completely through the transmission path. A radiation detector is positioned offset with respect to the transmission path for detecting photons that are scattered from the transmission path in response to interaction with the specimen passing therethrough. A controller determines from the detected scattered photons that a first material is present in the specimen.

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