X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-12-05
2009-12-15
Song, Hoon (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C250S269300
Reexamination Certificate
active
07634059
ABSTRACT:
An X-ray downhole imaging tool is provided and includes an X-ray tube capable of operating at least at 50 KeV and emitting at least one hundred micro-amperes of continuous electron current and a radiation detector axially displaced from the X-ray tube, at least partially shielded therefrom and radially directed. In certain embodiments, the radiation detector includes a microchannel plate and a resistive anode. In certain embodiments, a second detector which is axially directed is also provided.
REFERENCES:
patent: 5680431 (1997-10-01), Pietras, III et al.
patent: 5910654 (1999-06-01), Becker et al.
patent: 2007/0041501 (2007-02-01), Ramstad et al.
Castano Jaime
Fonseca Darla P.
Schlumberger Technology Corporation
Song Hoon
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