Diffractometer and method for diffraction analysis

Details Diffractometer and method for diffraction analysis Diffractometer and method for diffraction analysis

2007-08-21

2007-08-21

Kao, Chih-Cheng G (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S072000, C378S073000, C250S305000, C250S306000, C250S390090

Reexamination Certificate

active

10502101

ABSTRACT:
Diffractometer and method for diffraction analysis making use of two Euler cradles, a primary and a secondary Euler cradle. The primary Euler cradle supports a source of a radiation beam, having a collimation axis, and a radiation beam detector, having a reception axis, said collimation and reception axis, conveying in a centre of the diffractometer which is fixed with respect to the primary Euler cradle. The source and detector are adapted to move along the primary Euler cradle. The secondary Euler cradle supports the primary Euler cradle and is arranged to rotate the latter.

REFERENCES:
patent: 2843749 (1958-07-01), Koblenz
patent: 4769832 (1988-09-01), Louiday
patent: 4922512 (1990-05-01), Lajus et al.
patent: 5014293 (1991-05-01), Boyd et al.
patent: 5359640 (1994-10-01), Fink et al.
patent: 6064717 (2000-05-01), Ortega et al.
patent: 6072854 (2000-06-01), Kikuchi et al.
patent: 1016375 (2000-05-01), None
patent: 2198920 (1988-06-01), None

Affiliated with

Also associated with

Rating

Diffractometer and method for diffraction analysis does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Diffractometer and method for diffraction analysis, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Diffractometer and method for diffraction analysis will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3834872