LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Spherical mirror grazing incidence x-ray optics

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Spot filmer cassette transport vibration support

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Steerable x-ray optical system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Stereotactic mammography system imaging

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Stress measurement method using X-ray diffraction

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Structural parameter analyzing apparatus and analyzing method

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Structured anode X-ray source for X-ray microscopy

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Subassembly, method and system for monochromatizing X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Support device for a polycapillary optic

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Surface channeled X-ray tube

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Surface defect evaluating apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Synthesis and screening of ligands using X-ray crystallography

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and method for analyzing layers using x-ray transmission

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and method for matching diffraction patterns

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and method for matching diffraction patterns

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and method for reducing phase ambiguity of crystal...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and method for using X-ray diffraction to detect subsurfa

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and method for X-ray diffraction imaging

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and method for XRD-based threat detection